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- Lower Silesian Digital Library > Participants of the Consortium > 01. Wrocław University of Technology > Journals WUoT > Journals published at Wrocław University of Technology > Optica Applicata
- Lower Silesian Digital Library > Resources > 2. Czasopisma > Czasopisma współczesne
- Lower Silesian Digital Library > Fields of science > 6. Nauki ścisłe i przyrodnicze
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Jan 16, 2019
In our library since:
Apr 5, 2018
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5
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3
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https://www.dbc.wroc.pl/publication/44736
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Optica Applicata
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Optica Applicata, Vol. 1, 1971
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Optica Applicata, Vol. 2, 1972
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Optica Applicata, Vol. 3, 1973
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Optica Applicata, Vol. 4, 1974
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Optica Applicata, Vol. 5, 1975
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Optica Applicata, Vol. 6, 1976
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Optica Applicata, Vol. 7, 1977
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Optica Applicata, Vol. 8, 1978
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Optica Applicata, Vol. 9, 1979
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Optica Applicata, Vol. 10, 1980
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Optica Applicata, Vol. 11, 1981
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Optica Applicata, Vol. 12, 1982
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Optica Applicata, Vol. 13, 1983
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Optica Applicata, Vol. 14, 1984
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Optica Applicata, Vol. 15, 1985
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Optica Applicata, Vol. 16, 1986
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Optica Applicata, Vol. 17, 1987
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Optica Applicata, Vol. 18, 1988
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Optica Applicata, Vol. 19, 1989
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Optica Applicata, Vol. 20, 1990
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Optica Applicata, Vol. 21, 1991
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Optica Applicata, Vol. 22, 1992
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Optica Applicata, Vol. 23, 1993
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Optica Applicata, Vol. 24, 1994
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Optica Applicata, Vol. 25, 1995
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Optica Applicata, Vol. 26, 1996
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Optica Applicata, Vol. 27, 1997
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Optica Applicata, Vol. 28, 1998
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Optica Applicata, Vol. 29, 1999
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Optica Applicata, Vol. 30, 2000
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Optica Applicata, Vol. 31, 2001
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Optica Applicata, Vol. 32, 2002
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Optica Applicata, Vol. 33, 2003
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Optica Applicata, Vol. 33, 2003, nr 1
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Optica Applicata, Vol. 33, 2003, nr 2-3
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Optica Applicata, Vol. 33, 2003, nr 4
- Contents [Optica Applicata, Vol. 33, 2003, nr 4]
- Raman gain characterization in standard single mode optical fibres for optical simulation purposes
- Analysis of the spatial distribution of luminous intensity at the fibre output
- Scanning electron microscopy examination of telecommunication single mode fiber splices
- Selected problems in holographic memory design
- Holographic confocal microscope
- Investigations of multimode interference structures made by ion exchange in glass
- Accurate interference pattern analysis module of automatic measurement system
- Informational representation of fundamental phenomena in the digital electro-optical imaging devices
- Fluctuation of colliding-enhanced YAG phase-conjugate ring cavity in primary resonator stability
- Absolute photonic band gap from 2D square compound lattices
- Structural, optical and electrical characterization of Co-Pd doped TiO2 semiconducting thin films sputtered on silicon
- Thermal characterization of micro-devices with far and near field microscopy
- Just-enough-time signaling protocol: formal description using extended finite state machine (EFSM)
- Thin glass mirors for the Pierre Auger Project
- Referenceless testing of vortex optical beams
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Optica Applicata, Vol. 33, 2003, nr 1
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Optica Applicata, Vol. 34, 2004
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Optica Applicata, Vol. 35, 2005
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Optica Applicata, Vol. 36, 2006
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Optica Applicata, Vol. 37, 2007
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Optica Applicata, Vol. 38, 2008
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Optica Applicata, Vol. 39, 2009
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Optica Applicata, Vol. 40, 2010
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Optica Applicata, Vol. 41, 2011
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Optica Applicata, Vol. 42, 2012
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Optica Applicata, Vol. 43, 2013
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Optica Applicata, Vol. 44, 2014
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Optica Applicata, Vol. 45, 2015
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Optica Applicata, Vol. 46, 2016
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Optica Applicata, Vol. 47, 2017
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Optica Applicata, Vol. 1, 1971
| Edition name | Date |
|---|---|
| Structural, optical and electrical characterization of Co-Pd doped TiO2 semiconducting thin films sputtered on silicon | Jan 16, 2019 |
