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Idczak, Elżbieta Gaj, Miron. Redakcja

1973

artykuł

Optica Applicata

Optical Constants of Non-Transparent Chrome Layers for Wavelengths of 0.22-25 μm

Idczak, Elżbieta Gaj, Miron. Redakcja

1973

artykuł

Optica Applicata

Electron characteristics of chromium layers produced under various technological conditions

Idczak, Elżbieta Kościelniak, Lucyna Gaj, Kazimierz. Redakcja

1988

czasopismo

Optica Applicata

Structure and optical properties of chromium layers evaporated at different rates on substrates of different temperatures

Idczak, Elżbieta Kościelniak, Lucyna Gaj, Kazimierz. Redakcja

1988

czasopismo

Optica Applicata

Ellipsometric examination of anodized aluminium layers within the visible spectral range

Idczak, Elżbieta Oleszkiewicz, Ewa Gaj, Miron. Redakcja

1979

artykuł

Optica Applicata

The influence of the substrate temperature on optical constants for chromium layer in visible spectral range

Idczak, Elżbieta Rachwalska, Lucyna Gaj, Miron. Redakcja

1981

czasopismo

Optica Applicata

Ellipsometric examinations of thin ytterbium oxide layers on chromium

Idczak, Elżbieta Żukowska, Krystyna Gaj, Miron. Redakcja Wilk, Ireneusz. Redakcja

1978

artykuł

Optica Applicata

Letter to the Editor: An explanation of the untypical dependence of the refractive index upon the thickness of very thin ytterbium oxide layers on chromium

Idczak, Elżbieta Żukowska, Krystyna Gaj, Miron. Redakcja

1980

artykuł

Optica Applicata

Examination of thin dielectric films with ellipsometric method

Idczak, Elżbieta Oleszkiewicz, Ewa Żukowska, Krystyna Gaj, Miron. Redakcja

1979

artykuł

Optica Applicata

Letter to the Editor: An algorithm for determining the optical constants and thicknesses of thin absorbing layers from the ellipsometric measurements

Idczak, Elżbieta Oleszkiewicz, Ewa Spławski, Zdzisław Gaj, Miron. Redakcja

1981

czasopismo

Optica Applicata

Letter to the Editor: An algorithm for determining the refractive index and thickness of thin dielectric layers on an absorbing substrate on the basis of ellipsometric measurements

Idczak, Elżbieta Oleszkiewicz, Ewa Żukowska, Krystyna Gaj, Miron. Redakcja

1979

artykuł

Optica Applicata

Cube Beam Splitters for Different Values of Reflectance to Transmittance Coefficients of Light

Wesołowska, Cecylia Dobierzewska-Mozrzymas, Ewa Idczak, Elżbieta Marcinów, Tadeusz Pietrasik, J. Stolecki, Bonifacy

1972

artykuł

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Number of results: 12

Optical Properties of Non-Transparent Chrome Layers

Optical Constants of Non-Transparent Chrome Layers for Wavelengths of 0.22-25 μm

Electron characteristics of chromium layers produced under various technological conditions

Structure and optical properties of chromium layers evaporated at different rates on substrates of different temperatures

Ellipsometric examination of anodized aluminium layers within the visible spectral range

The influence of the substrate temperature on optical constants for chromium layer in visible spectral range

Ellipsometric examinations of thin ytterbium oxide layers on chromium

Letter to the Editor: An explanation of the untypical dependence of the refractive index upon the thickness of very thin ytterbium oxide layers on chromium

Examination of thin dielectric films with ellipsometric method

Letter to the Editor: An algorithm for determining the optical constants and thicknesses of thin absorbing layers from the ellipsometric measurements

Letter to the Editor: An algorithm for determining the refractive index and thickness of thin dielectric layers on an absorbing substrate on the basis of ellipsometric measurements

Cube Beam Splitters for Different Values of Reflectance to Transmittance Coefficients of Light

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