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Search for: [Abstrakt = "Microscope thermography with the use of thermovision camera with spatial resolution 8 μm was applied in testing temperature distribution in semiconductor lasers produced on the basis of nitrides. The conducted tests have shown that the microscope thermography has a potential in characterizing microelectronic devices like semiconductor laser diodes and can be considered as a complementary tool in establishing thermal characteristics of these devices."]

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Rybiński, Janusz Bednarek, Michał Wiśniewski, Przemysław Świetlik, Tomasz Gaj, Miron. Redakcja Urbańczyk, Wacław. Redakcja

2010
artykuł

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