Development and utilization of the nanomarkers for precise AFM tip positioning in the investigation of the surface morphology change - Sikora, Andrzej (Oficyna Wydawnicza Politechniki Wrocławskiej, 2013)
Optica Applicata, Vol. 43, 2013, nr 1, s. 163-171
Keywords: optyka; atomic force microscopy; material science; environmental tests; nanolithography; nanomarker