Accurate interference pattern analysis module of automatic measurement system - Whang, Allen J.; Chung, Chi-Kuei (Oficyna Wydawnicza Politechniki Wrocławskiej, 2003)
Optica Applicata, Vol. 33, 2003, nr 4, s. 627-634
Keywords: optyka; automatic measurement system; interferometry; integrate with interferometers; error-compensating algorithms