Scanning electron microscopy examination of telecommunication single mode fiber splices - Hejna, Jan; Ratuszek, Marek; Majewski, Jacek; Zakrzewski, Zbigniew (Oficyna Wydawnicza Politechniki Wrocławskiej, 2003)
Optica Applicata, Vol. 33, 2003, nr 4, s. 583-589
Keywords: optyka; single mode fibers; fiber splices; scanning electron microscopy; backscattered electrons; material contrast