Ellipsometry in optical studies of thin films conducted at the Institute of Physics of Wroclaw University of Technology - Żukowska, Krystyna; Oleszkiewicz, Ewa (Oficyna Wydawnicza Politechniki Wrocławskiej, 2001)
Optica Applicata, Vol. 31, 2001, nr 1, s. 35-51
Keywords: optyka