Depth dependent X-ray diffraction of porous anodic alumina films filled with cubic YAlO3:Tb3+ matrix - Serafińczuk, Jarosław; Pawlaczyk, Łukasz; Podhorodecki, Artur; Gaponenko, Nikolai; Molchan, Igor; Thompson, George (Oficyna Wydawnicza Politechniki Wrocławskiej, 2020)
Optica Applicata, Vol. 50, 2020, nr 1, s. 127-134
Keywords: optyka; PAA; X-ray diffraction; AFM; SEM; crystallization