Depth-resolved measurement of the compression displacement fields on the front and rear surfaces of an epoxy sample - Zhang, Wucong; Dong, Bo; Zhang, Wei; He, Zhaoshui; Xie, Shengli; Zhou, Yanzhou (Oficyna Wydawnicza Politechniki Wrocławskiej, 2018)
Optica Applicata, Vol. 48, 2018, nr 2, s. 311-323
Keywords: optyka; depth-resolved measurement; compression displacement field; wavenumber-scanning interferometry; epoxy