@misc{Jarząbek_Bożena_Distribution_2008,
 author={Jarząbek, Bożena and Weszka, Jan and Cisowski, Jan},
 contributor={Gaj, Miron. Redakcja and Urbańczyk, Wacław. Redakcja},
 year={2008},
 rights={Wszystkie prawa zastrzeżone (Copyright)},
 publisher={Oficyna Wydawnicza Politechniki Wrocławskiej},
 description={Optica Applicata, Vol. 38, 2008, nr 3, s. 575-583},
 language={eng},
 abstract={Transmission and fundamental reflectivity studies, completed on amorphous Zn-P thin films, allowed us to obtain parameters describing the fundamental absorption edge, i.e., the optical pseudogap EG, Urbach energy EU and exponential edge parameter ET. All these data, together with the results of earlier transport measurements, have been utilized in developing simple models of electronic structure (distribution of electronic states) for amorphous Zn-P thin films of two compositions, i.e., Zn57P43 (near stoichiometry of Zn3P2) and Zn32P68 (near stoichiometry of ZnP2).},
 title={Distribution of electronic states in amorphous Zn-P thin films on the basis of optical measurements},
 type={artykuł},
 keywords={optyka, amorphous semiconductors, thin films, absorption coefficient, model of electronic structure},
}