@misc{Jaglarz_Janusz_Studies_2010,
 author={Jaglarz, Janusz and Sanetra, Jerzy and Cisowski, Jan},
 contributor={Gaj, Miron. Redakcja and Urbańczyk, Wacław. Redakcja},
 year={2010},
 rights={Wszystkie prawa zastrzeżone (Copyright)},
 publisher={Oficyna Wydawnicza Politechniki Wrocławskiej},
 description={Optica Applicata, Vol. 40, 2010, nr 4, s. 767-772},
 language={eng},
 abstract={The optical reflection measurements of polyvinylocarbazole (PVK) and polyazomethine (PPI) thin films have been done by means of optical profilometry (OP) exhibiting many advantages in surface and subsurface investigations. The obtained OP images clearly demonstrate that the thickness of the polymer films under investigation is not uniform over their lateral dimensions. For the PVK thin film, the fast Fourier transform (FFT) in the inverse space of the OP image is also presented along with distribution of the surface highs.},
 title={Studies of polymer surface topography by means of optical profilometry},
 type={artykuł},
 keywords={optyka, optical profilometry, thin polymeric films},
}