@misc{Rybiński_Janusz_Application_2010,
 author={Rybiński, Janusz and Bednarek, Michał and Wiśniewski, Przemysław and Świetlik, Tomasz},
 contributor={Gaj, Miron. Redakcja and Urbańczyk, Wacław. Redakcja},
 year={2010},
 rights={Wszystkie prawa zastrzeżone (Copyright)},
 publisher={Oficyna Wydawnicza Politechniki Wrocławskiej},
 description={Optica Applicata, Vol. 40, 2010, nr 3, s. 609-614},
 language={eng},
 abstract={Microscope thermography with the use of thermovision camera with spatial resolution 8 μm was applied in testing temperature distribution in semiconductor lasers produced on the basis of nitrides. The conducted tests have shown that the microscope thermography has a potential in characterizing microelectronic devices like semiconductor laser diodes and can be considered as a complementary tool in establishing thermal characteristics of these devices.},
 title={Application of microscope thermography in testing temperature distribution in a semiconductor laser},
 type={artykuł},
 keywords={optyka, microscope thermography, blue lasers, semiconductor lasers},
}