@misc{Zhang_Hanlu_Measurement_2010,
 author={Zhang, Hanlu and Wu, Zhensen and Cao, Yunhua and Zhang, Geng},
 contributor={Gaj, Miron. Redakcja and Urbańczyk, Wacław. Redakcja},
 year={2010},
 rights={Wszystkie prawa zastrzeżone (Copyright)},
 publisher={Oficyna Wydawnicza Politechniki Wrocławskiej},
 description={Optica Applicata, Vol. 40, 2010, nr 1, s. 197-208},
 language={eng},
 abstract={Based on the Torrance–Sparrow model, a modified and simplified five-parameter model is obtained. Multi-angle bistatic reflectance data of surfaces of various materials are fitted using this model. Genetic algorithm is used to optimize the parameters for the model. The results of the five-parameter model are in good agreement with experimental data which do not take part in fitting, and are close to the results of two-dimensional bidirectional reflectance distribution function (BRDF) models. The five-parameter model shows a good applicability to various rough surfaces with different surface optical properties. The five-parameter model can be used to construct a three-dimensional BRDF distribution based on the spatial experimental data, which may provide more information on light scattering from rough surfaces.},
 title={Measurement and statistical modeling of BRDF of various samples},
 type={artykuł},
 keywords={optyka, bidirectional reflectance distribution function (BRDF), modeling, measurement, light scattering},
}